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X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case

X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case

Dades bibliogràfiques
Autors principals: Ludwig, W, Schmidt, S, Lauridsen, E, Poulsen, H
Format: Conference item
Publicat: 2008
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