X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид: Ludwig, W, Schmidt, S, Lauridsen, E, Poulsen, H
Формат: Conference item
Хэвлэсэн: 2008