An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging

Samankaltaisia teoksia

• High-angle annular dark field imaging simulation and its Debye-Waller factor dependence
  Tekijä: Cai, D, et al.
  Julkaistu: (1998)
• Subangstrom resolution imaging using annular dark-field STEM
  Tekijä: Nellist, P, et al.
  Julkaistu: (1999)
• Towards quantitative analysis of core-shell catalyst nanoparticles by aberration corrected high angle annular dark field STEM and EDX
  Tekijä: E, H, et al.
  Julkaistu: (2010)
• Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.
  Tekijä: De Backer, A, et al.
  Julkaistu: (2015)
• Towards quantitative analysis of core-shell catalyst nano-particles by aberration corrected high angle annular dark field STEM and EDX
  Tekijä: E, H, et al.
  Julkaistu: (2010)