An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging

Liknande verk

• High-angle annular dark field imaging simulation and its Debye-Waller factor dependence
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• Towards quantitative analysis of core-shell catalyst nanoparticles by aberration corrected high angle annular dark field STEM and EDX
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• Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.
  av: De Backer, A, et al.
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• Towards quantitative analysis of core-shell catalyst nano-particles by aberration corrected high angle annular dark field STEM and EDX
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