An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging
| Autors principals: | , , , |
|---|---|
| Format: | Journal article |
| Publicat: |
1997
|
| _version_ | 1826299144512208896 |
|---|---|
| author | Anderson, S Birkeland, C Anstis, G Cockayne, D |
| author_facet | Anderson, S Birkeland, C Anstis, G Cockayne, D |
| author_sort | Anderson, S |
| collection | OXFORD |
| description | |
| first_indexed | 2024-03-07T04:57:27Z |
| format | Journal article |
| id | oxford-uuid:d7167356-391b-49cd-8d70-ff0f52262127 |
| institution | University of Oxford |
| last_indexed | 2024-03-07T04:57:27Z |
| publishDate | 1997 |
| record_format | dspace |
| spelling | oxford-uuid:d7167356-391b-49cd-8d70-ff0f522621272022-03-27T08:38:31ZAn approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imagingJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:d7167356-391b-49cd-8d70-ff0f52262127Symplectic Elements at Oxford1997Anderson, SBirkeland, CAnstis, GCockayne, D |
| spellingShingle | Anderson, S Birkeland, C Anstis, G Cockayne, D An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging |
| title | An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging |
| title_full | An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging |
| title_fullStr | An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging |
| title_full_unstemmed | An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging |
| title_short | An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging |
| title_sort | approach to quantitative compositional profiling at near atomic resolution using high angle annular dark field imaging |
| work_keys_str_mv | AT andersons anapproachtoquantitativecompositionalprofilingatnearatomicresolutionusinghighangleannulardarkfieldimaging AT birkelandc anapproachtoquantitativecompositionalprofilingatnearatomicresolutionusinghighangleannulardarkfieldimaging AT anstisg anapproachtoquantitativecompositionalprofilingatnearatomicresolutionusinghighangleannulardarkfieldimaging AT cockayned anapproachtoquantitativecompositionalprofilingatnearatomicresolutionusinghighangleannulardarkfieldimaging AT andersons approachtoquantitativecompositionalprofilingatnearatomicresolutionusinghighangleannulardarkfieldimaging AT birkelandc approachtoquantitativecompositionalprofilingatnearatomicresolutionusinghighangleannulardarkfieldimaging AT anstisg approachtoquantitativecompositionalprofilingatnearatomicresolutionusinghighangleannulardarkfieldimaging AT cockayned approachtoquantitativecompositionalprofilingatnearatomicresolutionusinghighangleannulardarkfieldimaging |