Wilkinson, A., Meaden, G., & Dingley, D. (2013). High resolution mapping of strains and rotations using electron backscatter diffraction. Taylor and Francis.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रWilkinson, A., G. Meaden, और D. Dingley. High Resolution Mapping of Strains and Rotations Using Electron Backscatter Diffraction. Taylor and Francis, 2013.
एमएलए (9वां संस्करण) प्रशस्ति पत्रWilkinson, A., et al. High Resolution Mapping of Strains and Rotations Using Electron Backscatter Diffraction. Taylor and Francis, 2013.
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