$High resolution mapping of strains and rotations using electron backscatter diffraction$

High resolution mapping of strains and rotations using electron backscatter diffraction

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<p style="text-align:justify;"> The angular resolution of electron backscatter diffraction (EBSD) measurements can be significantly improved using an analysis based on determination of small shifts in features from one pattern to the next using cross-correlation functions. Using pat...

Bibliografiset tiedot
Päätekijät:	Wilkinson, A, Meaden, G, Dingley, D
Aineistotyyppi:	Journal article
Kieli:	English
Julkaistu:	Taylor and Francis 2013

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