$High resolution mapping of strains and rotations using electron backscatter diffraction$

High resolution mapping of strains and rotations using electron backscatter diffraction

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<p style="text-align:justify;"> The angular resolution of electron backscatter diffraction (EBSD) measurements can be significantly improved using an analysis based on determination of small shifts in features from one pattern to the next using cross-correlation functions. Using pat...

書目詳細資料
Main Authors:	Wilkinson, A, Meaden, G, Dingley, D
格式:	Journal article
語言:	English
出版:	Taylor and Francis 2013

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