$High resolution mapping of strains and rotations using electron backscatter diffraction$

High resolution mapping of strains and rotations using electron backscatter diffraction

Show other versions (1)

<p style="text-align:justify;"> The angular resolution of electron backscatter diffraction (EBSD) measurements can be significantly improved using an analysis based on determination of small shifts in features from one pattern to the next using cross-correlation functions. Using pat...

书目详细资料
Main Authors:	Wilkinson, A, Meaden, G, Dingley, D
格式:	Journal article
语言:	English
出版:	Taylor and Francis 2013

相似书籍

High resolution mapping of strains and rotations using electron backscatter diffraction
由: Wilkinson, A, et al.
出版: (2006)

Strain mapping using electron backscatter diffraction
由: Wilkinson, A, et al.
出版: (2009)

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
由: Wilkinson, A, et al.
出版: (2006)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
由: Dingley, D, et al.
出版: (2010)

Mapping strains at the nanoscale using electron back scatter diffraction
由: Wilkinson, A, et al.
出版: (2009)

Strain tensor mapping at the nanoscale using electron back scatter diffraction
由: Wilkinson, A, et al.
出版: (2006)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
由: Britton, T, et al.
出版: (2010)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
由: Britton, T, et al.
出版: (2011)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
由: Britton, T, et al.
出版: (2012)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
由: Wilkinson, A
出版: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
由: Wilkinson, A
出版: (2006)

Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
由: Nowakowski Pawel, et al.
出版: (2024-01-01)

Analysis of dislocation densities using high resolution electron backscatter diffraction
由: Vilalta-Clemente, A, et al.
出版: (2015)

High-resolution electron backscatter diffraction in III-nitride semiconductors
由: Vilalta-Clemente, A, et al.
出版: (2015)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
由: Koko, A, et al.
出版: (2022)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
由: Wallis, D, et al.
出版: (2019)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
由: Tong, V, et al.
出版: (2015)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
由: Wilkinson, A, et al.
出版: (2010)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
由: Kamaya, M, et al.
出版: (2005)

Adaptable physics-based super-resolution for electron backscatter diffraction maps
由: Devendra K. Jangid, et al.
出版: (2022-12-01)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
由: Wallis, D, et al.
出版: (2016)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
由: Wilkinson, A
出版: (1997)

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
由: Koko, A, et al.
出版: (2023)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
由: Wilkinson, A, et al.
出版: (2016)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
由: Kamaya, M, et al.
出版: (2006)

Probing deformation and revealing microstructural mechanisms with cross-correlation-based, high-resolution electron backscatter diffraction
由: Britton, T, et al.
出版: (2013)

Direct detection of electron backscatter diffraction patterns.
由: Wilkinson, A, et al.
出版: (2013)

Rapid electron backscatter diffraction mapping: painting by numbers
由: Tong, V, et al.
出版: (2018)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
由: Britton, T, et al.
出版: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
由: Britton, T, et al.
出版: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment
由: Britton, T, et al.
出版: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
由: Britton, T, et al.
出版: (2013)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
由: Tong, V, et al.
出版: (2015)

Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
由: Jiang, J, et al.
出版: (2013)

High resolution electron backscatter diffraction study on the heterogeneities of tetragonal distortion in Fe-C martensite at the microstructural scale
由: Tanaka, T, et al.
出版: (2020)

J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction
由: Koko, A, et al.
出版: (2021)

A high resolution electron backscatter diffraction study of heterogeneous deformation in polycrystal copper
由: Jiang, J
出版: (2013)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
由: Naresh-Kumar, G, et al.
出版: (2017)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
由: G. Naresh-Kumar, et al.
出版: (2017-09-01)

Electron backscatter diffraction in the silicon nanowires
由: K.K. Dikhanbayev, et al.
出版: (2016-10-01)