APA引文

Glaisher, R., & Cockayne, D. (1993). CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING.

Chicago Style (17th ed.) Citation

Glaisher, R., and D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

MLA引文

Glaisher, R., and D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

警告：這些引文格式不一定是100％准確.