Glaisher, R., & Cockayne, D. (1993). CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING.
芝加哥风格引文Glaisher, R., 与 D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.
MLA引文Glaisher, R., 与 D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.
警告：这些引文格式不一定是100％准确.