Cita APA (7th ed.)

Glaisher, R., & Cockayne, D. (1993). CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING.

Cita Chicago (17th ed.)

Glaisher, R., i D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

Cita MLA (9th ed.)

Glaisher, R., i D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.