APA (7th ed.) Citation

Glaisher, R., & Cockayne, D. (1993). CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING.

Chicago Style (17th ed.) Citation

Glaisher, R., and D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

MLA (9th ed.) Citation

Glaisher, R., and D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

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