Lua APA (7ú heag.)

Glaisher, R., & Cockayne, D. (1993). CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING.

Lua i Stíl Chicago (17ú heag.)

Glaisher, R., agus D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

Lua MLA (9ú heag.)

Glaisher, R., agus D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.