Cita APA

Glaisher, R., & Cockayne, D. (1993). CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING.

Citación estilo Chicago

Glaisher, R., and D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

Cita MLA

Glaisher, R., and D. Cockayne. CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING. 1993.

Warning: These citations may not always be 100% accurate.