CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
Main Authors: | Glaisher, R, Cockayne, D |
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Format: | Journal article |
Udgivet: |
1993
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Lignende værker
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DISLOCATION GEOMETRIES IN SEMICONDUCTORS AND IN SEMICONDUCTOR HETEROSTRUCTURES
af: Cockayne, D, et al.
Udgivet: (1991) -
LATTICE FRINGE IMAGING OF MODULATED STRUCTURES
af: Cockayne, D, et al.
Udgivet: (1981) -
RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
af: Grovenor, C, et al.
Udgivet: (1985) -
Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis.
af: Anstis, G, et al.
Udgivet: (2003) -
CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY
af: Zou, J, et al.
Udgivet: (1991)