CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING

مواد مشابهة

• DISLOCATION GEOMETRIES IN SEMICONDUCTORS AND IN SEMICONDUCTOR HETEROSTRUCTURES
  حسب: Cockayne, D, وآخرون
  منشور في: (1991)
• LATTICE FRINGE IMAGING OF MODULATED STRUCTURES
  حسب: Cockayne, D, وآخرون
  منشور في: (1981)
• RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
  حسب: Grovenor, C, وآخرون
  منشور في: (1985)
• Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis.
  حسب: Anstis, G, وآخرون
  منشور في: (2003)
• CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY
  حسب: Zou, J, وآخرون
  منشور في: (1991)