FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS
Autors principals: | King, R, Mackenzie, R, Smith, G, Cade, N, Vide, S |
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Format: | Conference item |
Publicat: |
1994
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Ítems similars
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FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM-SILICIDE-COATED SILICON EMITTERS
per: King, R, et al.
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ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE ON SILICON
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FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF GRIDDED SILICON FIELD EMITTERS
per: Huang, M, et al.
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ATOM-PROBE ANALYSIS AND FIELD-EMISSION STUDIES OF SILICON
per: King, R, et al.
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STUDIES OF POROUS SILICON FIELD EMITTERS
per: Boswell, E, et al.
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