FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	King, R, Mackenzie, R, Smith, G, Cade, N, Vide, S
Μορφή:	Conference item
Έκδοση:	1994

Παρόμοια τεκμήρια

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM-SILICIDE-COATED SILICON EMITTERS
ανά: King, R, κ.ά.
Έκδοση: (1995)

ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE ON SILICON
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FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF GRIDDED SILICON FIELD EMITTERS
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ATOM-PROBE ANALYSIS AND FIELD-EMISSION STUDIES OF SILICON
ανά: King, R, κ.ά.
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STUDIES OF POROUS SILICON FIELD EMITTERS
ανά: Boswell, E, κ.ά.
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ανά: Bhatti, A, κ.ά.
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Polycrystalline silicon field emitters
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Polycrystalline silicon field emitters
ανά: Boswell, E, κ.ά.
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Use of coated silicon field emitters as neutralisers for fundamental physics space missions
ανά: Aplin, K, κ.ά.
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Use of coated silicon field emitters as neutralisers for fundamental physics space missions
ανά: Aplin, K, κ.ά.
Έκδοση: (2011)

STUDIES OF POROUS SILICON FIELD EMITTERS
ανά: Boswell, E, κ.ά.
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Fabrication of gated polycrystalline silicon field emitters
ανά: Huq, SE, κ.ά.
Έκδοση: (1996)

AIN coatings on silicon field emitters and oxidised gates to enhance reliability for space applications
ανά: Wang, L, κ.ά.
Έκδοση: (2004)

Silicon and silicide nanowires : applications, fabrication, and properties /
ανά: Huang, Yu, editor, κ.ά.
Έκδοση: (2014)

CHARACTERIZATION OF GRIDDED FIELD EMITTERS
ανά: Huang, M, κ.ά.
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Anodisation of gridded silicon field emitter arrays
ανά: Huang, M, κ.ά.
Έκδοση: (1997)

Characterisation of porous silicon field emitter properties
ανά: Boswell, E, κ.ά.
Έκδοση: (1995)

Characterization of porous silicon field emitter properties
ανά: Boswell, E, κ.ά.
Έκδοση: (1996)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
ανά: Grovenor, C, κ.ά.
Έκδοση: (1992)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
ανά: Godfrey, T, κ.ά.
Έκδοση: (1989)

FIELD DESORPTION MICROSCOPY OF CARBON-COATED FIELD ELECTRON EMITTERS
ανά: D.P. Bernatskii, κ.ά.
Έκδοση: (2021-12-01)

AN ATOM PROBE STUDY OF THE ANOMALOUS FIELD EVAPORATION OF ALLOYS CONTAINING SILICON
ανά: Miller, M, κ.ά.
Έκδοση: (1981)

Erbium silicided schottky source/drain silicon nanowire N-metal–oxide–semiconductor field-effect transistors
ανά: Tan, Eu Jin, κ.ά.
Έκδοση: (2013)

Transmission electron microscope studies of emitters of silicon bipolar transistors
ανά: Gold, D, κ.ά.
Έκδοση: (1989)

Enhanced field emission from polysilicon emitters using porous silicon
ανά: Pullen, SE, κ.ά.
Έκδοση: (1996)

Modelling of the field emission microtriode with emitter covered with porous silicon
ανά: Nicolaescu, D, κ.ά.
Έκδοση: (1996)

Microfabrication and characterization of gridded polycrystalline silicon field emitter devices
ανά: Huq, SE, κ.ά.
Έκδοση: (1998)

Reliability tests of gated silicon field emitters for use in space
ανά: Aplin, K, κ.ά.
Έκδοση: (2004)

Microfabrication and characterisation of gridded polycrystalline silicon field emitter devices
ανά: Huq, SE, κ.ά.
Έκδοση: (1997)

Study of Silicide Formation in Large Diameter Monocrystalline Silicon
ανά: Abdugafur T. Mamadalimov, κ.ά.
Έκδοση: (2024-06-01)

Properties of “Higher Manganese Silicide-Silicon” Heterostructure
ανά: Kobiljon K. ugli Kurbonaliev, κ.ά.
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Highly scaled silicon field emitter arrays with integrated silicon nanowire current limiters
ανά: Guerrera, Stephen A. (Stephen Angelo)
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FIELD-ION MICROSCOPE ATOM-PROBE ANALYSIS OF THE EFFECT OF RRA HEAT-TREATMENT ON THE MATRIX STRENGTHENING PRECIPITATES IN ALLOY AL-7150
ανά: Warren, P, κ.ά.
Έκδοση: (1992)

Investigation of fabrication uniformity and emission reliability of silicon field emitters for use in space
ανά: Wang, L, κ.ά.
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Three-dimensional atomic mapping of ligands on palladium nanoparticles by atom probe tomography
ανά: Kyuseon Jang, κ.ά.
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Simulation Modelling of Silicon Gated Field Emitter Based Electronic Circuits
ανά: Hay, Robert, κ.ά.
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Residual gas effects on the emission characteristics of silicon field emitter arrays
ανά: Gilkes, M, κ.ά.
Έκδοση: (2000)

Simulation Modelling of Silicon Gated Field Emitter Based Electronic Circuits
ανά: Robert Hay, κ.ά.
Έκδοση: (2023-11-01)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Grovenor, C, κ.ά.
Έκδοση: (1983)

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
ανά: Hono, K., κ.ά.
Έκδοση: (1998-01-01)