FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS

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Xehetasun bibliografikoak
Egile Nagusiak:	King, R, Mackenzie, R, Smith, G, Cade, N, Vide, S
Formatua:	Conference item
Argitaratua:	1994

Antzeko izenburuak

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM-SILICIDE-COATED SILICON EMITTERS
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Polycrystalline silicon field emitters
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Use of coated silicon field emitters as neutralisers for fundamental physics space missions
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Fabrication of gated polycrystalline silicon field emitters
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AIN coatings on silicon field emitters and oxidised gates to enhance reliability for space applications
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Silicon and silicide nanowires : applications, fabrication, and properties /
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CHARACTERIZATION OF GRIDDED FIELD EMITTERS
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Anodisation of gridded silicon field emitter arrays
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Characterisation of porous silicon field emitter properties
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Characterization of porous silicon field emitter properties
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Enhanced field emission from polysilicon emitters using porous silicon
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Modelling of the field emission microtriode with emitter covered with porous silicon
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Microfabrication and characterization of gridded polycrystalline silicon field emitter devices
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Reliability tests of gated silicon field emitters for use in space
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Microfabrication and characterisation of gridded polycrystalline silicon field emitter devices
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Study of Silicide Formation in Large Diameter Monocrystalline Silicon
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Properties of “Higher Manganese Silicide-Silicon” Heterostructure
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Investigation of fabrication uniformity and emission reliability of silicon field emitters for use in space
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Three-dimensional atomic mapping of ligands on palladium nanoparticles by atom probe tomography
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Simulation Modelling of Silicon Gated Field Emitter Based Electronic Circuits
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Residual gas effects on the emission characteristics of silicon field emitter arrays
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Simulation Modelling of Silicon Gated Field Emitter Based Electronic Circuits
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Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
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