FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS

Taispeáin leaganacha eile (1)

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	King, R, Mackenzie, R, Smith, G, Cade, N, Vide, S
Formáid:	Conference item
Foilsithe / Cruthaithe:	1994

Míreanna comhchosúla

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM-SILICIDE-COATED SILICON EMITTERS
de réir: King, R, et al.
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ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE ON SILICON
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FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF GRIDDED SILICON FIELD EMITTERS
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ATOM-PROBE ANALYSIS AND FIELD-EMISSION STUDIES OF SILICON
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STUDIES OF POROUS SILICON FIELD EMITTERS
de réir: Boswell, E, et al.
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FIELD-ION MICROSCOPE ATOM PROBE STUDIES OF METALLIC GLASSES
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Polycrystalline silicon field emitters
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Polycrystalline silicon field emitters
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Use of coated silicon field emitters as neutralisers for fundamental physics space missions
de réir: Aplin, K, et al.
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Use of coated silicon field emitters as neutralisers for fundamental physics space missions
de réir: Aplin, K, et al.
Foilsithe / Cruthaithe: (2011)

STUDIES OF POROUS SILICON FIELD EMITTERS
de réir: Boswell, E, et al.
Foilsithe / Cruthaithe: (1995)

Fabrication of gated polycrystalline silicon field emitters
de réir: Huq, SE, et al.
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AIN coatings on silicon field emitters and oxidised gates to enhance reliability for space applications
de réir: Wang, L, et al.
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Silicon and silicide nanowires : applications, fabrication, and properties /
de réir: Huang, Yu, editor, et al.
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CHARACTERIZATION OF GRIDDED FIELD EMITTERS
de réir: Huang, M, et al.
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Anodisation of gridded silicon field emitter arrays
de réir: Huang, M, et al.
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Characterisation of porous silicon field emitter properties
de réir: Boswell, E, et al.
Foilsithe / Cruthaithe: (1995)

Characterization of porous silicon field emitter properties
de réir: Boswell, E, et al.
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ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
de réir: Grovenor, C, et al.
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FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
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FIELD DESORPTION MICROSCOPY OF CARBON-COATED FIELD ELECTRON EMITTERS
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AN ATOM PROBE STUDY OF THE ANOMALOUS FIELD EVAPORATION OF ALLOYS CONTAINING SILICON
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Erbium silicided schottky source/drain silicon nanowire N-metal–oxide–semiconductor field-effect transistors
de réir: Tan, Eu Jin, et al.
Foilsithe / Cruthaithe: (2013)

Transmission electron microscope studies of emitters of silicon bipolar transistors
de réir: Gold, D, et al.
Foilsithe / Cruthaithe: (1989)

Enhanced field emission from polysilicon emitters using porous silicon
de réir: Pullen, SE, et al.
Foilsithe / Cruthaithe: (1996)

Modelling of the field emission microtriode with emitter covered with porous silicon
de réir: Nicolaescu, D, et al.
Foilsithe / Cruthaithe: (1996)

Microfabrication and characterization of gridded polycrystalline silicon field emitter devices
de réir: Huq, SE, et al.
Foilsithe / Cruthaithe: (1998)

Reliability tests of gated silicon field emitters for use in space
de réir: Aplin, K, et al.
Foilsithe / Cruthaithe: (2004)

Microfabrication and characterisation of gridded polycrystalline silicon field emitter devices
de réir: Huq, SE, et al.
Foilsithe / Cruthaithe: (1997)

Study of Silicide Formation in Large Diameter Monocrystalline Silicon
de réir: Abdugafur T. Mamadalimov, et al.
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Properties of “Higher Manganese Silicide-Silicon” Heterostructure
de réir: Kobiljon K. ugli Kurbonaliev, et al.
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Highly scaled silicon field emitter arrays with integrated silicon nanowire current limiters
de réir: Guerrera, Stephen A. (Stephen Angelo)
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FIELD-ION MICROSCOPE ATOM-PROBE ANALYSIS OF THE EFFECT OF RRA HEAT-TREATMENT ON THE MATRIX STRENGTHENING PRECIPITATES IN ALLOY AL-7150
de réir: Warren, P, et al.
Foilsithe / Cruthaithe: (1992)

Investigation of fabrication uniformity and emission reliability of silicon field emitters for use in space
de réir: Wang, L, et al.
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Three-dimensional atomic mapping of ligands on palladium nanoparticles by atom probe tomography
de réir: Kyuseon Jang, et al.
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Simulation Modelling of Silicon Gated Field Emitter Based Electronic Circuits
de réir: Hay, Robert, et al.
Foilsithe / Cruthaithe: (2023)

Residual gas effects on the emission characteristics of silicon field emitter arrays
de réir: Gilkes, M, et al.
Foilsithe / Cruthaithe: (2000)

Simulation Modelling of Silicon Gated Field Emitter Based Electronic Circuits
de réir: Robert Hay, et al.
Foilsithe / Cruthaithe: (2023-11-01)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1983)

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
de réir: Hono, K., et al.
Foilsithe / Cruthaithe: (1998-01-01)