FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE COATED SILICON EMITTERS

Čájet eará veršuvnnaid (1)

Bibliográfalaš dieđut
Váldodahkkit:	King, R, Mackenzie, R, Smith, G, Cade, N, Vide, S
Materiálatiipa:	Conference item
Almmustuhtton:	1994

Geahča maid

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM-SILICIDE-COATED SILICON EMITTERS
Dahkki: King, R, et al.
Almmustuhtton: (1995)

ATOM-PROBE FIELD-ION MICROSCOPE STUDIES OF PALLADIUM SILICIDE ON SILICON
Dahkki: King, R, et al.
Almmustuhtton: (1995)

FIELD-EMISSION AND ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF GRIDDED SILICON FIELD EMITTERS
Dahkki: Huang, M, et al.
Almmustuhtton: (1994)

ATOM-PROBE ANALYSIS AND FIELD-EMISSION STUDIES OF SILICON
Dahkki: King, R, et al.
Almmustuhtton: (1994)

STUDIES OF POROUS SILICON FIELD EMITTERS
Dahkki: Boswell, E, et al.
Almmustuhtton: (1994)

FIELD-ION MICROSCOPE ATOM PROBE STUDIES OF METALLIC GLASSES
Dahkki: Bhatti, A, et al.
Almmustuhtton: (1985)

Polycrystalline silicon field emitters
Dahkki: Boswell, E, et al.
Almmustuhtton: (1995)

Polycrystalline silicon field emitters
Dahkki: Boswell, E, et al.
Almmustuhtton: (1996)

Use of coated silicon field emitters as neutralisers for fundamental physics space missions
Dahkki: Aplin, K, et al.
Almmustuhtton: (2011)

Use of coated silicon field emitters as neutralisers for fundamental physics space missions
Dahkki: Aplin, K, et al.
Almmustuhtton: (2011)

STUDIES OF POROUS SILICON FIELD EMITTERS
Dahkki: Boswell, E, et al.
Almmustuhtton: (1995)

Fabrication of gated polycrystalline silicon field emitters
Dahkki: Huq, SE, et al.
Almmustuhtton: (1996)

AIN coatings on silicon field emitters and oxidised gates to enhance reliability for space applications
Dahkki: Wang, L, et al.
Almmustuhtton: (2004)

Silicon and silicide nanowires : applications, fabrication, and properties /
Dahkki: Huang, Yu, editor, et al.
Almmustuhtton: (2014)

CHARACTERIZATION OF GRIDDED FIELD EMITTERS
Dahkki: Huang, M, et al.
Almmustuhtton: (1994)

Anodisation of gridded silicon field emitter arrays
Dahkki: Huang, M, et al.
Almmustuhtton: (1997)

Characterisation of porous silicon field emitter properties
Dahkki: Boswell, E, et al.
Almmustuhtton: (1995)

Characterization of porous silicon field emitter properties
Dahkki: Boswell, E, et al.
Almmustuhtton: (1996)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1992)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
Dahkki: Godfrey, T, et al.
Almmustuhtton: (1989)

FIELD DESORPTION MICROSCOPY OF CARBON-COATED FIELD ELECTRON EMITTERS
Dahkki: D.P. Bernatskii, et al.
Almmustuhtton: (2021-12-01)

AN ATOM PROBE STUDY OF THE ANOMALOUS FIELD EVAPORATION OF ALLOYS CONTAINING SILICON
Dahkki: Miller, M, et al.
Almmustuhtton: (1981)

Erbium silicided schottky source/drain silicon nanowire N-metal–oxide–semiconductor field-effect transistors
Dahkki: Tan, Eu Jin, et al.
Almmustuhtton: (2013)

Transmission electron microscope studies of emitters of silicon bipolar transistors
Dahkki: Gold, D, et al.
Almmustuhtton: (1989)

Enhanced field emission from polysilicon emitters using porous silicon
Dahkki: Pullen, SE, et al.
Almmustuhtton: (1996)

Modelling of the field emission microtriode with emitter covered with porous silicon
Dahkki: Nicolaescu, D, et al.
Almmustuhtton: (1996)

Microfabrication and characterization of gridded polycrystalline silicon field emitter devices
Dahkki: Huq, SE, et al.
Almmustuhtton: (1998)

Reliability tests of gated silicon field emitters for use in space
Dahkki: Aplin, K, et al.
Almmustuhtton: (2004)

Microfabrication and characterisation of gridded polycrystalline silicon field emitter devices
Dahkki: Huq, SE, et al.
Almmustuhtton: (1997)

Study of Silicide Formation in Large Diameter Monocrystalline Silicon
Dahkki: Abdugafur T. Mamadalimov, et al.
Almmustuhtton: (2024-06-01)

Properties of “Higher Manganese Silicide-Silicon” Heterostructure
Dahkki: Kobiljon K. ugli Kurbonaliev, et al.
Almmustuhtton: (2023-09-01)

Highly scaled silicon field emitter arrays with integrated silicon nanowire current limiters
Dahkki: Guerrera, Stephen A. (Stephen Angelo)
Almmustuhtton: (2016)

FIELD-ION MICROSCOPE ATOM-PROBE ANALYSIS OF THE EFFECT OF RRA HEAT-TREATMENT ON THE MATRIX STRENGTHENING PRECIPITATES IN ALLOY AL-7150
Dahkki: Warren, P, et al.
Almmustuhtton: (1992)

Investigation of fabrication uniformity and emission reliability of silicon field emitters for use in space
Dahkki: Wang, L, et al.
Almmustuhtton: (2006)

Three-dimensional atomic mapping of ligands on palladium nanoparticles by atom probe tomography
Dahkki: Kyuseon Jang, et al.
Almmustuhtton: (2021-07-01)

Simulation Modelling of Silicon Gated Field Emitter Based Electronic Circuits
Dahkki: Hay, Robert, et al.
Almmustuhtton: (2023)

Residual gas effects on the emission characteristics of silicon field emitter arrays
Dahkki: Gilkes, M, et al.
Almmustuhtton: (2000)

Simulation Modelling of Silicon Gated Field Emitter Based Electronic Circuits
Dahkki: Robert Hay, et al.
Almmustuhtton: (2023-11-01)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1983)

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
Dahkki: Hono, K., et al.
Almmustuhtton: (1998-01-01)