Analytic twist angle measurement in liquid crystal cells
Previously we have described a method to measure residual twist angle in homogeneously aligned liquid crystal cells by comparing experimental results with simulated data in an electric field. This allows determination of a small twist angle to an accuracy of 0.02°. In this paper, an analytic method...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
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2009
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| _version_ | 1826300343713005568 |
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| author | Lee, C Salter, P Raynes, E Elston, S |
| author_facet | Lee, C Salter, P Raynes, E Elston, S |
| author_sort | Lee, C |
| collection | OXFORD |
| description | Previously we have described a method to measure residual twist angle in homogeneously aligned liquid crystal cells by comparing experimental results with simulated data in an electric field. This allows determination of a small twist angle to an accuracy of 0.02°. In this paper, an analytic method is described whereby it is possible to determine the small twist angle directly from the measured transmission without simulation. A simple equation for the twist angle independent of any material parameters is derived and its reliability and accuracy confirmed by comparison with the results of the previous method. © 2009 American Institute of Physics. |
| first_indexed | 2024-03-07T05:15:42Z |
| format | Journal article |
| id | oxford-uuid:dd1a3404-42dc-4667-b40b-c137c001aa30 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T05:15:42Z |
| publishDate | 2009 |
| record_format | dspace |
| spelling | oxford-uuid:dd1a3404-42dc-4667-b40b-c137c001aa302022-03-27T09:22:37ZAnalytic twist angle measurement in liquid crystal cellsJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:dd1a3404-42dc-4667-b40b-c137c001aa30EnglishSymplectic Elements at Oxford2009Lee, CSalter, PRaynes, EElston, SPreviously we have described a method to measure residual twist angle in homogeneously aligned liquid crystal cells by comparing experimental results with simulated data in an electric field. This allows determination of a small twist angle to an accuracy of 0.02°. In this paper, an analytic method is described whereby it is possible to determine the small twist angle directly from the measured transmission without simulation. A simple equation for the twist angle independent of any material parameters is derived and its reliability and accuracy confirmed by comparison with the results of the previous method. © 2009 American Institute of Physics. |
| spellingShingle | Lee, C Salter, P Raynes, E Elston, S Analytic twist angle measurement in liquid crystal cells |
| title | Analytic twist angle measurement in liquid crystal cells |
| title_full | Analytic twist angle measurement in liquid crystal cells |
| title_fullStr | Analytic twist angle measurement in liquid crystal cells |
| title_full_unstemmed | Analytic twist angle measurement in liquid crystal cells |
| title_short | Analytic twist angle measurement in liquid crystal cells |
| title_sort | analytic twist angle measurement in liquid crystal cells |
| work_keys_str_mv | AT leec analytictwistanglemeasurementinliquidcrystalcells AT salterp analytictwistanglemeasurementinliquidcrystalcells AT raynese analytictwistanglemeasurementinliquidcrystalcells AT elstons analytictwistanglemeasurementinliquidcrystalcells |