Synchrotron XRD study of residual stress in a shot peened Al/SiC(p) composite
In the present study, residual strain profiles in shot peened specimens of 2124-T4 aluminium alloy matrix composite reinforced with 17vol% particulate silicon carbide (SiCp) were measured by means of synchrotron-based diffraction using monochromatic, high energy X-ray beams. The stress state was con...
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| Format: | Conference item |
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2009
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| Summary: | In the present study, residual strain profiles in shot peened specimens of 2124-T4 aluminium alloy matrix composite reinforced with 17vol% particulate silicon carbide (SiCp) were measured by means of synchrotron-based diffraction using monochromatic, high energy X-ray beams. The stress state was considered in relation with the microstructural and morphological modifications induced in the material by shot peening. Strain-induced changes in the lattice parameters were deduced from diffraction measurements made by two detectors mounted in the horizontal and vertical diffraction planes, providing information on lattice strains in two nearly mutually perpendicular in-plane directions. On the basis of these data, residual strain and stress profiles through the specimen thickness were reconstructed for both phases (silicon carbide and aluminium alloy). Microstructural characterization was performed by means of optical and scanning electron microscopy (SEM), and particle distribution and hardness modification were identified. The effect of shot peening on the reinforcement and matrix stress states was evaluated. The findings are discussed in the context of process optimization for fatigue resistance improvement in aluminium alloy-based MMCs. |
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