Imaging nonradiative point defects buried in quantum wells using cathodoluminescence
<p>Crystallographic point defects (PDs) can dramatically decrease the efficiency of optoelectronic semiconductor devices, many of which are based on quantum well (QW) heterostructures. However, spatially resolving individual nonradiative PDs buried in such QWs has so far not been demonstrated...
Hlavní autoři: | Weatherley, TFK, Liu, W, Osokin, V, Alexander, DTL, Taylor, RA, Carlin, J-F, Butté, R, Grandjean, N |
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Médium: | Journal article |
Jazyk: | English |
Vydáno: |
American Chemical Society
2021
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