Imaging nonradiative point defects buried in quantum wells using cathodoluminescence

Imaging nonradiative point defects buried in quantum wells using cathodoluminescence

<p>Crystallographic point defects (PDs) can dramatically decrease the efficiency of optoelectronic semiconductor devices, many of which are based on quantum well (QW) heterostructures. However, spatially resolving individual nonradiative PDs buried in such QWs has so far not been demonstrated...

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מידע ביבליוגרפי
Main Authors: Weatherley, TFK, Liu, W, Osokin, V, Alexander, DTL, Taylor, RA, Carlin, J-F, Butté, R, Grandjean, N
פורמט: Journal article
שפה:English
יצא לאור: American Chemical Society 2021

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