ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS

Bibliographic Details
Main Authors: Wilkinson, A, Hirsch, P, Czernuszka, J, Long, N
Format: Conference item
Published: 1993
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author Wilkinson, A
Hirsch, P
Czernuszka, J
Long, N
author_facet Wilkinson, A
Hirsch, P
Czernuszka, J
Long, N
author_sort Wilkinson, A
collection OXFORD
description
first_indexed 2024-03-07T05:20:17Z
format Conference item
id oxford-uuid:dea4eed4-3cd0-4b20-a6c2-2db8cc675c44
institution University of Oxford
last_indexed 2024-03-07T05:20:17Z
publishDate 1993
record_format dspace
spelling oxford-uuid:dea4eed4-3cd0-4b20-a6c2-2db8cc675c442022-03-27T09:33:45ZELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORSConference itemhttp://purl.org/coar/resource_type/c_5794uuid:dea4eed4-3cd0-4b20-a6c2-2db8cc675c44Symplectic Elements at Oxford1993Wilkinson, AHirsch, PCzernuszka, JLong, N
spellingShingle Wilkinson, A
Hirsch, P
Czernuszka, J
Long, N
ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
title ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
title_full ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
title_fullStr ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
title_full_unstemmed ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
title_short ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
title_sort electron channeling contrast imaging of defects in semiconductors
work_keys_str_mv AT wilkinsona electronchannelingcontrastimagingofdefectsinsemiconductors
AT hirschp electronchannelingcontrastimagingofdefectsinsemiconductors
AT czernuszkaj electronchannelingcontrastimagingofdefectsinsemiconductors
AT longn electronchannelingcontrastimagingofdefectsinsemiconductors