Electronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devices
| Main Authors: | , |
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| Format: | Journal article |
| Published: |
2005
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| _version_ | 1797099262419402752 |
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| author | Giustino, F Pasquarello, A |
| author_facet | Giustino, F Pasquarello, A |
| author_sort | Giustino, F |
| collection | OXFORD |
| description | |
| first_indexed | 2024-03-07T05:21:16Z |
| format | Journal article |
| id | oxford-uuid:df00994a-e923-4ab8-8147-fa7fb6f90300 |
| institution | University of Oxford |
| last_indexed | 2024-03-07T05:21:16Z |
| publishDate | 2005 |
| record_format | dspace |
| spelling | oxford-uuid:df00994a-e923-4ab8-8147-fa7fb6f903002022-03-27T09:36:05ZElectronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devicesJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:df00994a-e923-4ab8-8147-fa7fb6f90300Symplectic Elements at Oxford2005Giustino, FPasquarello, A |
| spellingShingle | Giustino, F Pasquarello, A Electronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devices |
| title | Electronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devices |
| title_full | Electronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devices |
| title_fullStr | Electronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devices |
| title_full_unstemmed | Electronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devices |
| title_short | Electronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devices |
| title_sort | electronic and dielectric properties of a suboxide interlayer at the silicon oxide interface in mos devices |
| work_keys_str_mv | AT giustinof electronicanddielectricpropertiesofasuboxideinterlayeratthesiliconoxideinterfaceinmosdevices AT pasquarelloa electronicanddielectricpropertiesofasuboxideinterlayeratthesiliconoxideinterfaceinmosdevices |