Marchant, S., van der Vaart, M., Pillay, K., Baxter, L., Bhatt, A., Fitzgibbon, S., . . . Slater, R. (2024). A machine learning artefact detection method for single-channel infant event-related potential studies. IOP Publishing.
芝加哥风格引文Marchant, S., M. van der Vaart, K. Pillay, L. Baxter, A. Bhatt, S. Fitzgibbon, C. Hartley, 与 R. Slater. A Machine Learning Artefact Detection Method for Single-channel Infant Event-related Potential Studies. IOP Publishing, 2024.
MLA引文Marchant, S., et al. A Machine Learning Artefact Detection Method for Single-channel Infant Event-related Potential Studies. IOP Publishing, 2024.
警告：这些引文格式不一定是100％准确.