3D lattice distortions and defect structures in ion-implanted nano-crystals
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+ ), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale revolutionised sample preparation across...
| Những tác giả chính: | , , , , , , , , , |
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| Định dạng: | Journal article |
| Được phát hành: |
Springer Nature
2017
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