Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization
Detectors are revolutionising possibilities in scanning transmission electron microscopy, because of the advent of direct electron detectors that record at high quantum efficiency and with high frame rate. This allows the whole back focal plane to be captured for each pixel in a scan and the dataset...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
AIP Publishing
2020
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| _version_ | 1797099625779298304 |
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| author | MacLaren, I Macgregor, TA Allen, CS Kirkland, AI |
| author_facet | MacLaren, I Macgregor, TA Allen, CS Kirkland, AI |
| author_sort | MacLaren, I |
| collection | OXFORD |
| description | Detectors are revolutionising possibilities in scanning transmission electron microscopy, because of the advent of direct electron detectors that record at high quantum efficiency and with high frame rate. This allows the whole back focal plane to be captured for each pixel in a scan and the dataset to be processed to reveal whichever features are of interest. There are many possible uses for this advance of direct relevance to understanding the nano- and atomic-scale structure of materials and heterostructures. This article gives our perspective of the current state of the field and some of the directions where it is likely to go next. Firstly, a wider overview is given of recent work in this area, before two specific examples are given of its application, one of imaging strain in thin films, and one of imaging changes in periodicity along the beam direction as the result of the formation of an ordered structure in an epitaxial thin film. This is followed by an outlook is presented as to future possible directions in this rapidly expanding field. |
| first_indexed | 2024-03-07T05:26:21Z |
| format | Journal article |
| id | oxford-uuid:e0b2845c-0a70-43c5-9a9a-3a9058441d04 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T05:26:21Z |
| publishDate | 2020 |
| publisher | AIP Publishing |
| record_format | dspace |
| spelling | oxford-uuid:e0b2845c-0a70-43c5-9a9a-3a9058441d042022-03-27T09:49:08ZDetectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterizationJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:e0b2845c-0a70-43c5-9a9a-3a9058441d04EnglishSymplectic ElementsAIP Publishing2020MacLaren, IMacgregor, TAAllen, CSKirkland, AIDetectors are revolutionising possibilities in scanning transmission electron microscopy, because of the advent of direct electron detectors that record at high quantum efficiency and with high frame rate. This allows the whole back focal plane to be captured for each pixel in a scan and the dataset to be processed to reveal whichever features are of interest. There are many possible uses for this advance of direct relevance to understanding the nano- and atomic-scale structure of materials and heterostructures. This article gives our perspective of the current state of the field and some of the directions where it is likely to go next. Firstly, a wider overview is given of recent work in this area, before two specific examples are given of its application, one of imaging strain in thin films, and one of imaging changes in periodicity along the beam direction as the result of the formation of an ordered structure in an epitaxial thin film. This is followed by an outlook is presented as to future possible directions in this rapidly expanding field. |
| spellingShingle | MacLaren, I Macgregor, TA Allen, CS Kirkland, AI Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization |
| title | Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization |
| title_full | Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization |
| title_fullStr | Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization |
| title_full_unstemmed | Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization |
| title_short | Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization |
| title_sort | detectors the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization |
| work_keys_str_mv | AT maclareni detectorstheongoingrevolutioninscanningtransmissionelectronmicroscopyandwhythisimportanttomaterialcharacterization AT macgregorta detectorstheongoingrevolutioninscanningtransmissionelectronmicroscopyandwhythisimportanttomaterialcharacterization AT allencs detectorstheongoingrevolutioninscanningtransmissionelectronmicroscopyandwhythisimportanttomaterialcharacterization AT kirklandai detectorstheongoingrevolutioninscanningtransmissionelectronmicroscopyandwhythisimportanttomaterialcharacterization |