Langford, R., Huang, Y., Lozano-Perez, S., & Titchmarsh, J. (2001). Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system.
Cita Chicago (17th ed.)Langford, R., Y. Huang, S. Lozano-Perez, i J. Titchmarsh. Preparation of Site Specific Transmission Electron Microscopy Plan-view Specimens Using a Focused Ion Beam System. 2001.
Cita MLA (9th ed.)Langford, R., et al. Preparation of Site Specific Transmission Electron Microscopy Plan-view Specimens Using a Focused Ion Beam System. 2001.
Atenció: Aquestes cites poden no estar 100% correctes.