Langford, R., Huang, Y., Lozano-Perez, S., & Titchmarsh, J. (2001). Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system.
Style de citation Chicago (17e éd.)Langford, R., Y. Huang, S. Lozano-Perez, et J. Titchmarsh. Preparation of Site Specific Transmission Electron Microscopy Plan-view Specimens Using a Focused Ion Beam System. 2001.
Style de citation MLA (9e éd.)Langford, R., et al. Preparation of Site Specific Transmission Electron Microscopy Plan-view Specimens Using a Focused Ion Beam System. 2001.
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