Langford, R., Huang, Y., Lozano-Perez, S., & Titchmarsh, J. (2001). Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system.

Langford, R., Y. Huang, S. Lozano-Perez, and J. Titchmarsh. Preparation of Site Specific Transmission Electron Microscopy Plan-view Specimens Using a Focused Ion Beam System. 2001.

Langford, R., et al. Preparation of Site Specific Transmission Electron Microscopy Plan-view Specimens Using a Focused Ion Beam System. 2001.