Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
A focused ion beam system was used to prepare site specific transmission electron microscopy plan view specimens. A new technique was used for this purpose. It consisted of milling a wedge shaped piece of material, lifting it out using needle and micromanipulator, and orientating it on the substrate...
| Những tác giả chính: | , , , |
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| Định dạng: | Journal article |
| Ngôn ngữ: | English |
| Được phát hành: |
2001
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| _version_ | 1826301322225254400 |
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| author | Langford, R Huang, Y Lozano-Perez, S Titchmarsh, J |
| author_facet | Langford, R Huang, Y Lozano-Perez, S Titchmarsh, J |
| author_sort | Langford, R |
| collection | OXFORD |
| description | A focused ion beam system was used to prepare site specific transmission electron microscopy plan view specimens. A new technique was used for this purpose. It consisted of milling a wedge shaped piece of material, lifting it out using needle and micromanipulator, and orientating it on the substrate with the original surface vertical. Based on the lift-out technique for the preparation of a cross-section specimen, the plane-view specimen was then milled from this piece of material. |
| first_indexed | 2024-03-07T05:30:39Z |
| format | Journal article |
| id | oxford-uuid:e22a2bf7-6d2f-41c5-a929-38bc5b66c6af |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T05:30:39Z |
| publishDate | 2001 |
| record_format | dspace |
| spelling | oxford-uuid:e22a2bf7-6d2f-41c5-a929-38bc5b66c6af2022-03-27T09:59:07ZPreparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam systemJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:e22a2bf7-6d2f-41c5-a929-38bc5b66c6afEnglishSymplectic Elements at Oxford2001Langford, RHuang, YLozano-Perez, STitchmarsh, JA focused ion beam system was used to prepare site specific transmission electron microscopy plan view specimens. A new technique was used for this purpose. It consisted of milling a wedge shaped piece of material, lifting it out using needle and micromanipulator, and orientating it on the substrate with the original surface vertical. Based on the lift-out technique for the preparation of a cross-section specimen, the plane-view specimen was then milled from this piece of material. |
| spellingShingle | Langford, R Huang, Y Lozano-Perez, S Titchmarsh, J Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system |
| title | Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system |
| title_full | Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system |
| title_fullStr | Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system |
| title_full_unstemmed | Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system |
| title_short | Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system |
| title_sort | preparation of site specific transmission electron microscopy plan view specimens using a focused ion beam system |
| work_keys_str_mv | AT langfordr preparationofsitespecifictransmissionelectronmicroscopyplanviewspecimensusingafocusedionbeamsystem AT huangy preparationofsitespecifictransmissionelectronmicroscopyplanviewspecimensusingafocusedionbeamsystem AT lozanoperezs preparationofsitespecifictransmissionelectronmicroscopyplanviewspecimensusingafocusedionbeamsystem AT titchmarshj preparationofsitespecifictransmissionelectronmicroscopyplanviewspecimensusingafocusedionbeamsystem |