Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system

Veure altres versions (1)

A focused ion beam system was used to prepare site specific transmission electron microscopy plan view specimens. A new technique was used for this purpose. It consisted of milling a wedge shaped piece of material, lifting it out using needle and micromanipulator, and orientating it on the substrate...

Descripció completa

Dades bibliogràfiques
Autors principals:	Langford, R, Huang, Y, Lozano-Perez, S, Titchmarsh, J
Format:	Journal article
Idioma:	English
Publicat:	2001

Ítems similars

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
per: Langford, R, et al.
Publicat: (2001)

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling
per: Huang, Y, et al.
Publicat: (2002)

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling.
per: Huang, Y, et al.
Publicat: (2002)

Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes
per: Langford, R, et al.
Publicat: (2001)

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
per: Larson, D, et al.
Publicat: (1999)

Field-ion specimen preparation using focused ion-beam milling
per: Larson, D, et al.
Publicat: (1999)

Focused ion-beam milling for field-ion specimen preparation: preliminary investigations
per: Larson, D, et al.
Publicat: (1998)

Preparation of TEM specimens containing stress corrosion cracks in austenitic alloys using FIB
per: Lozano-Perez, S, et al.
Publicat: (2001)

Specimen preparation for transmission electron microscopy of materials /
per: 262434 Goodhew, Peter J.
Publicat: (1984)

Combination of focused ion beam (FIB) and microtome by ultrathin slice preparation for transmission electron microscopy (TEM) observation
per: Yuchen Xu, et al.
Publicat: (2018-09-01)

Focused Ion Beam-Prepared Transmission Electron Microscopy Examination of Atmospheric Chemical Vapor-Infiltrated Silicon Carbide Morphology
per: Zachary Tobin, et al.
Publicat: (2020-12-01)

An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam
per: Halpin, J, et al.
Publicat: (2019)

Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy
per: P. Lagrain, et al.
Publicat: (2024-06-01)

Site‐specific specimen preparation for SIMS analysis of radioactive samples
per: Liu, J, et al.
Publicat: (2020)

Deposition of site-specific metallic nanostructures with focused ion beam
per: Wang, Fang
Publicat: (2010)

Light and focused ion beam microscopy workflow for resin-embedded tissues
per: Horacio Merchant-Larios, et al.
Publicat: (2023-01-01)

Self-organized amorphous material in silicon(001) by focused ion beam (FIB) system
per: Huang, Y, et al.
Publicat: (2005)

Correlative Analysis of Immunoreactivity in Confocal Laser-Scanning Microscopy and Scanning Electron Microscopy with Focused Ion Beam Milling
per: Takahiro eSonomura, et al.
Publicat: (2013-02-01)

Preparative Methods for Nanoanalysis of Materials with Focused Ion Beam Instruments
per: Philipp M. Nellen, et al.
Publicat: (2006-11-01)

Investigation of Focused Ion and Electron Beam Platinum Carbon Nano-Tips with Transmission Electron Microscopy for Quantum Tunneling Vacuum Gap Applications
per: Michael Haub, et al.
Publicat: (2021-12-01)

Internal Structure of Asian Dust Particles over the Western North Pacific: Analyses Using Focused Ion Beam and Transmission Electron Microscopy
per: Sayako Ueda, et al.
Publicat: (2020-01-01)

Source Shot Noise Mitigation in Focused Ion Beam Microscopy by Time-Resolved Measurement
per: Peng, Minxu, et al.
Publicat: (2021)

Resolving physical interactions between bacteria and nanotopographies with focused ion beam scanning electron microscopy
per: Joshua Jenkins, et al.
Publicat: (2021-07-01)

Correlative in vivo 2 photon and focused ion beam scanning electron microscopy of cortical neurons.
per: Bohumil Maco, et al.
Publicat: (2013-01-01)

Numerical focusing and the field of view in interference microscopy
per: Anton Grebenyuk, et al.
Publicat: (2018-02-01)

Xenon plasma focused ion beam lamella fabrication on high-pressure frozen specimens for structural cell biology
per: Berger, C, et al.
Publicat: (2025)

Xenon plasma focused ion beam lamella fabrication on high-pressure frozen specimens for structural cell biology
per: Casper Berger, et al.
Publicat: (2025-03-01)

Focused ion beam nanoscale patterned transmission-enhanced fiber-optic tips
per: Wang, Houxiao, et al.
Publicat: (2014)

Focused Ion Beam Fabrication
per: Melngailis, John, et al.
Publicat: (2010)

Focused Ion Beam Fabrication
per: Melngailis, John, et al.
Publicat: (2010)

Focused Ion Beam Fabrication
per: Melngailis, John, et al.
Publicat: (2010)

Focused Ion Beam Microfabrication
per: Melngailis, John, et al.
Publicat: (2010)

Focused Ion Beam Fabrication
per: Melngailis, John, et al.
Publicat: (2010)

Focused Ion Beam Fabrication
per: Lezec, Henri J., et al.
Publicat: (2010)

Focused Ion Beam Fabrication
per: Musil, Christian, et al.
Publicat: (2010)

Focused Ion Beam Microfabrication
per: Melngailis, John, et al.
Publicat: (2010)

Focused Ion Beam Fabrication
per: Melngailis, John, et al.
Publicat: (2010)

Detection of silver nanoparticles inside marine diatom Thalassiosira pseudonana by electron microscopy and focused ion beam.
per: César Pascual García, et al.
Publicat: (2014-01-01)

Reading the Fine Print: Ultra-Microstructures of Foraminiferal Calcification Revealed Using Focused Ion Beam Microscopy
per: Yukiko Nagai, et al.
Publicat: (2018-02-01)

Sharpening of field-ion specimens and positioning of features of interest by ion-beam milling
per: Larson, D, et al.
Publicat: (2000)