Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
A focused ion beam system was used to prepare site specific transmission electron microscopy plan view specimens. A new technique was used for this purpose. It consisted of milling a wedge shaped piece of material, lifting it out using needle and micromanipulator, and orientating it on the substrate...
| প্রধান লেখক: | , , , |
|---|---|
| বিন্যাস: | Journal article |
| ভাষা: | English |
| প্রকাশিত: |
2001
|
Search Result 1
Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
প্রকাশিত 2001
Journal article