Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities.
In order to fully exploit structure-property relations of nanomaterials, three-dimensional (3D) characterization at the atomic scale is often required. In recent years, the resolution of electron tomography has reached the atomic scale. However, such tomography typically requires several projection...
| Հիմնական հեղինակներ: | , , , , , , , |
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| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
Royal Society of Chemistry
2017
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