Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities.

Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities.

In order to fully exploit structure-property relations of nanomaterials, three-dimensional (3D) characterization at the atomic scale is often required. In recent years, the resolution of electron tomography has reached the atomic scale. However, such tomography typically requires several projection...

書誌詳細
主要な著者:	De Backer, A, Jones, L, Lobato, I, Altantzis, T, Goris, B, Nellist, P, Bals, S, Van Aert, S
フォーマット:	Journal article
言語:	English
出版事項:	Royal Society of Chemistry 2017

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