Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities.

Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities.

In order to fully exploit structure-property relations of nanomaterials, three-dimensional (3D) characterization at the atomic scale is often required. In recent years, the resolution of electron tomography has reached the atomic scale. However, such tomography typically requires several projection...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид:	De Backer, A, Jones, L, Lobato, I, Altantzis, T, Goris, B, Nellist, P, Bals, S, Van Aert, S
Формат:	Journal article
Хэл сонгох:	English
Хэвлэсэн:	Royal Society of Chemistry 2017

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