Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005.

Dettagli Bibliografici
Autori principali: Dellby, N, Krivanek, O, Murfitt, M, Nellist, P
Natura: Journal article
Lingua:English
Pubblicazione: 2005