Wilshaw, P., & Fell, T. (1995). Electron beam induced current investigations of transition metal impurities at extended defects in silicon. Electrochemical Soc Inc.
Παραπομπή σε μορφή Chicago (17η εκδ.)Wilshaw, P., και T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.
Παραπομπή σε μορφή MLA (9th εκδ.)Wilshaw, P., και T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.
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