APA ציטוט

Wilshaw, P., & Fell, T. (1995). Electron beam induced current investigations of transition metal impurities at extended defects in silicon. Electrochemical Soc Inc.

Chicago Style (17th ed.) Citation

Wilshaw, P., and T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.

ציטוט MLA

Wilshaw, P., and T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.