Wilshaw, P., & Fell, T. (1995). Electron beam induced current investigations of transition metal impurities at extended defects in silicon. Electrochemical Soc Inc.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रWilshaw, P., और T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.
एमएलए (9वां संस्करण) प्रशस्ति पत्रWilshaw, P., और T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.
चेतावनी: ये उद्धरण हमेशा 100% सटीक नहीं हो सकते हैं.