Wilshaw, P., & Fell, T. (1995). Electron beam induced current investigations of transition metal impurities at extended defects in silicon. Electrochemical Soc Inc.
Citazione stile Chigago Style (17a edizione)Wilshaw, P., e T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.
Citatione MLA (9a ed.)Wilshaw, P., e T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.