Wilshaw, P., & Fell, T. (1995). Electron beam induced current investigations of transition metal impurities at extended defects in silicon. Electrochemical Soc Inc.
Citação norma ChicagoWilshaw, P., and T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.
Citação norma MLAWilshaw, P., and T. Fell. Electron Beam Induced Current Investigations of Transition Metal Impurities at Extended Defects in Silicon. Electrochemical Soc Inc, 1995.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.