Hydrogen induced degradation: a possible mechanism for light- and elevated temperature- induced degradation in n-type silicon
In this work, we demonstrate a form of minority carrier degradation on n-type Cz silicon that affects both the bulk and surface related lifetimes. We identify three key behaviors of the degradation mechanism; 1) a firing dependence for the extent of degradation, 2) the appearance of bulk degradation...
| Main Authors: | , , , , , , , , , , , |
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| Format: | Journal article |
| Published: |
Elsevier
2018
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