Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation
In this report, an optimised method for residual stress determination at the microscopic scale is presented. The newly proposed approach involves incremental Focused Ion Beam (FIB) milling of annular trenches at material surface, combined with high resolution SEM imaging of a previously deposited ma...
| Главные авторы: | , , |
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| Формат: | Journal article |
| Язык: | English |
| Опубликовано: |
2010
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