Atomic-resolution STM of a system with strongly correlated electrons: NiO(001) surface structure and defect sites

Atomic-resolution STM of a system with strongly correlated electrons: NiO(001) surface structure and defect sites

Bibliográfalaš dieđut
Váldodahkkit:	Castell, M, Wincott, P, Condon, N, Muggelberg, C, Thornton, G, Dudarev, S, Sutton, A, Briggs, G
Materiálatiipa:	Journal article
Almmustuhtton:	1997

Geahča maid

Atomic resolution STM of the NiO(001) surface structure and defect sites: c(2x2) patterning and effects of covalent bonding
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Almmustuhtton: (1997)

Surface structure and bonding in the strongly correlated metal oxides NiO and UO2
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Unexpected differences in the surface electronic structure of NiO and CoO observed by STM and explained by first-principles theory
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Covalent bonding in NiO: Evidence from a combined STM, LSDA plus U and EELS study
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Imaging insulating oxides by elevated-temperature STM
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Bulk and surface electronic structure of NiO and CoO: a comparative ab initio LSDA+U analysis and application to the interpretation of STM images
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Understanding STM images and EELS spectra of oxides with strongly correlated electrons: a comparison of nickel and uranium oxides
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Surface states on NiO (100) and the origin of the contrast reversal in atomically resolved scanning tunneling microscope images
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An STM study of surface structures on WO3(001)
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The adsorption and decomposition of H2S on Ge(001): An STM study
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Comparing a porphyrin- and a coumarin-based dye adsorbed on NiO(001)
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Heteroepitaxial growth of InN islands studied by STM and AFM
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Defect formation on CeO2(111) surfaces after annealing studied by STM
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Strong Deep-Level-Emission Photoluminescence in NiO Nanoparticles
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Supercapacitor Performance of NiO, NiO-MWCNT, and NiO–Fe-MWCNT Composites
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STM and STS of oxide ultrathin films
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Atomically perfect bismuth lines on Si(001)
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Elevated-temperature STM study of Ge and Si growth on Si(001) from GeH4 and Si2H6
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Ultrafast coupled charge and spin dynamics in strongly correlated NiO
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The effect of annealing temperatures on the optical parameters of NiO0.99Cu0.01 thin films
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