White, G., Seryi, A., Woodley, M., Marin, E., Kamiya, Y., Bai, S., . . . Yamanaka, T. (2010). Operational experiences tuning the ATF2 final focus optics towards obtaining A 37 nano-meter electron beam IP spot size.
Chicago Style (17th ed.) CitationWhite, G., et al. Operational Experiences Tuning the ATF2 Final Focus Optics Towards Obtaining A 37 Nano-meter Electron Beam IP Spot Size. 2010.
MLA (9th ed.) CitationWhite, G., et al. Operational Experiences Tuning the ATF2 Final Focus Optics Towards Obtaining A 37 Nano-meter Electron Beam IP Spot Size. 2010.
Warning: These citations may not always be 100% accurate.