Determination of X-ray flux using silicon pin diodes

Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here...

תיאור מלא

מידע ביבליוגרפי
Main Authors: Owen, R, Holton, J, Schulze-Briese, C, Garman, E
פורמט: Journal article
שפה:English
יצא לאור: International Union of Crystallography 2009
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